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Analysis of anisotropic ionization coefficient in bulk 4H-SiC with full-band Monte Carlo simulation

Authors :
Yoshinari Kamakura
Y. Ueoka
K. Konaga
T. Kotani
R. Fujita
Nobuya Mori
Source :
2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).
Publication Year :
2017
Publisher :
IEEE, 2017.

Abstract

High-field electron transport characteristics in bulk 4H-SiC are simulated with the full-band Monte Carlo method, and anisotropy of the ionization coefficient α is discussed. The simulation results exhibit larger α along 〈1120〉 direction than 〈0001〉 direction, which is consistent with the experimental observation. Furthermore, the dependence of α on the electric field direction θ is investigated. Compared to the existing analytical model, the present simulation results show a steeper increase when θ is tilted from the c-axis, which is originated from the anisotropic nature of the hot-electron heating.

Details

Database :
OpenAIRE
Journal :
2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
Accession number :
edsair.doi...........e4a300beb709dc9df85a5251d1e0430b
Full Text :
https://doi.org/10.23919/sispad.2017.8085321