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CMOS-compatible batch processing of monolayer MoS2MOSFETs

Authors :
Nicholas C. Strandwitz
Roderick J. Marstell
Asher Madjar
Mehmet Kaynak
Alexander Goritz
Hyun Kim
Jihoon Park
C. Wipf
Kuanchen Xiong
James C. M. Hwang
Matthias Wietstruck
Lei Li
Young Hee Lee
Xi Luo
Source :
Journal of Physics D: Applied Physics. 51:15LT02
Publication Year :
2018
Publisher :
IOP Publishing, 2018.

Abstract

Thousands of high-performance 2D metal-oxide-semiconductor field effect transistors (MOSFETs) were fabricated on wafer-scale chemical vapor deposited MoS2 with fully-CMOS-compatible processes such as photolithography and aluminum metallurgy. The yield was greater than 50% in terms of effective gate control with less-than-10 V threshold voltage, even for MOSFETs having deep-submicron gate length. The large number of fabricated MOSFETs allowed statistics to be gathered and the main yield limiter to be attributed to the weak adhesion between the transferred MoS2 and the substrate. With cut-off frequencies approaching the gigahertz range, the performances of the MOSFETs were comparable to that of state-of-the-art MoS2 MOSFETs, whether the MoS2 was grown by a thin-film process or exfoliated from a bulk crystal.

Details

ISSN :
13616463 and 00223727
Volume :
51
Database :
OpenAIRE
Journal :
Journal of Physics D: Applied Physics
Accession number :
edsair.doi...........e4b0c7308f0f87238b4373336a1e7dcb
Full Text :
https://doi.org/10.1088/1361-6463/aab4ba