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CMOS-compatible batch processing of monolayer MoS2MOSFETs
- Source :
- Journal of Physics D: Applied Physics. 51:15LT02
- Publication Year :
- 2018
- Publisher :
- IOP Publishing, 2018.
-
Abstract
- Thousands of high-performance 2D metal-oxide-semiconductor field effect transistors (MOSFETs) were fabricated on wafer-scale chemical vapor deposited MoS2 with fully-CMOS-compatible processes such as photolithography and aluminum metallurgy. The yield was greater than 50% in terms of effective gate control with less-than-10 V threshold voltage, even for MOSFETs having deep-submicron gate length. The large number of fabricated MOSFETs allowed statistics to be gathered and the main yield limiter to be attributed to the weak adhesion between the transferred MoS2 and the substrate. With cut-off frequencies approaching the gigahertz range, the performances of the MOSFETs were comparable to that of state-of-the-art MoS2 MOSFETs, whether the MoS2 was grown by a thin-film process or exfoliated from a bulk crystal.
- Subjects :
- Materials science
Yield (engineering)
Acoustics and Ultrasonics
chemistry.chemical_element
02 engineering and technology
Substrate (electronics)
01 natural sciences
law.invention
Aluminium
law
0103 physical sciences
Monolayer
Limiter
010302 applied physics
business.industry
021001 nanoscience & nanotechnology
Condensed Matter Physics
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Threshold voltage
chemistry
Optoelectronics
Field-effect transistor
Photolithography
0210 nano-technology
business
Subjects
Details
- ISSN :
- 13616463 and 00223727
- Volume :
- 51
- Database :
- OpenAIRE
- Journal :
- Journal of Physics D: Applied Physics
- Accession number :
- edsair.doi...........e4b0c7308f0f87238b4373336a1e7dcb
- Full Text :
- https://doi.org/10.1088/1361-6463/aab4ba