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Accumulated Charge Measurement: Control of the Interfacial Depletion Layer by Offset Voltage and Estimation of Band Gap and Electron Injection Barrier
- Source :
- The Journal of Physical Chemistry C. 125:1990-1998
- Publication Year :
- 2021
- Publisher :
- American Chemical Society (ACS), 2021.
-
Abstract
- This study investigates the charge injection barrier at the phthalocyanine (H2Pc)/Pd using accumulated charge measurement (ACM). Because the hole injection barrier is relatively small, the voltage ...
- Subjects :
- Materials science
Input offset voltage
business.industry
Band gap
Charge (physics)
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
chemistry.chemical_compound
General Energy
Depletion region
chemistry
Electron injection
Phthalocyanine
Optoelectronics
Physical and Theoretical Chemistry
Charge injection
business
Voltage
Subjects
Details
- ISSN :
- 19327455 and 19327447
- Volume :
- 125
- Database :
- OpenAIRE
- Journal :
- The Journal of Physical Chemistry C
- Accession number :
- edsair.doi...........e681294474e4ed329f07cee94ea3c29b