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Accumulated Charge Measurement: Control of the Interfacial Depletion Layer by Offset Voltage and Estimation of Band Gap and Electron Injection Barrier

Authors :
Kazusuke Maenaka
Hiroyuki Tajima
Toshiaki Tanimura
Sunao Shimomoto
Takeshi Komino
Tomofumi Kadoya
Tokuji Yokomatsu
Source :
The Journal of Physical Chemistry C. 125:1990-1998
Publication Year :
2021
Publisher :
American Chemical Society (ACS), 2021.

Abstract

This study investigates the charge injection barrier at the phthalocyanine (H2Pc)/Pd using accumulated charge measurement (ACM). Because the hole injection barrier is relatively small, the voltage ...

Details

ISSN :
19327455 and 19327447
Volume :
125
Database :
OpenAIRE
Journal :
The Journal of Physical Chemistry C
Accession number :
edsair.doi...........e681294474e4ed329f07cee94ea3c29b