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Polarized Memory Effect Observed on Se-SnO2 System

Authors :
Teiichi Yamagami
Tatsuhiko Matsushita
Masahiro Okuda
Source :
Japanese Journal of Applied Physics. 11:1657
Publication Year :
1972
Publisher :
IOP Publishing, 1972.

Abstract

The polarized memory effect (the memory in which switching between ON and OFF states depends on the polarity of the bias voltage) on the Se-SnO2 system is described. This effect is observed on the samples with Se films 300∼5000 Å in thickness. The ratio of the resistance of OFF state R O F F to that of ON state R O N is about three orders of magnitude. In the case of the film with thickness 103 Å, the threshold voltage from OFF to ON states V t h is 15 V, and the reverse voltage from ON to OFF states V r is 3.5 V.

Details

ISSN :
13474065 and 00214922
Volume :
11
Database :
OpenAIRE
Journal :
Japanese Journal of Applied Physics
Accession number :
edsair.doi...........e7151588201c930219be778bc040f8fc
Full Text :
https://doi.org/10.1143/jjap.11.1657