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Polarized Memory Effect Observed on Se-SnO2 System
- Source :
- Japanese Journal of Applied Physics. 11:1657
- Publication Year :
- 1972
- Publisher :
- IOP Publishing, 1972.
-
Abstract
- The polarized memory effect (the memory in which switching between ON and OFF states depends on the polarity of the bias voltage) on the Se-SnO2 system is described. This effect is observed on the samples with Se films 300∼5000 Å in thickness. The ratio of the resistance of OFF state R O F F to that of ON state R O N is about three orders of magnitude. In the case of the film with thickness 103 Å, the threshold voltage from OFF to ON states V t h is 15 V, and the reverse voltage from ON to OFF states V r is 3.5 V.
Details
- ISSN :
- 13474065 and 00214922
- Volume :
- 11
- Database :
- OpenAIRE
- Journal :
- Japanese Journal of Applied Physics
- Accession number :
- edsair.doi...........e7151588201c930219be778bc040f8fc
- Full Text :
- https://doi.org/10.1143/jjap.11.1657