Microwave surface resistance measurement of hts films using dielectric resonators

An open-ended dielectric resonator method and experimental apparatus for measuring microwave surface resistance of the high Tc superconducting thin films are reported. Making use of two sapphire rods the quality factor related to the losses of the resonator except its superconducting part can be evaluated. The Rs value of an individual superconducting thin film can be determined without any assistance of other superconducting films or calibrators. This measurement provides a convenient and absolute approach for Rs-measurement of high Tc superconducting thin films. Also the error in the Rs-measurement with the method was discussed.