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Microstructural and Optoelectronic Properties of SiGe:H Films at the Transition Edge Fabricated by PECVD
- Source :
- Crystal Research and Technology. 53:1700141
- Publication Year :
- 2018
- Publisher :
- Wiley, 2018.
- Subjects :
- Materials science
business.industry
02 engineering and technology
General Chemistry
021001 nanoscience & nanotechnology
Condensed Matter Physics
01 natural sciences
Plasma-enhanced chemical vapor deposition
0103 physical sciences
Optoelectronics
General Materials Science
010306 general physics
0210 nano-technology
business
Transition edge
Subjects
Details
- ISSN :
- 02321300
- Volume :
- 53
- Database :
- OpenAIRE
- Journal :
- Crystal Research and Technology
- Accession number :
- edsair.doi...........ea0a2c13d763e70ace87bb9c409dbaf6
- Full Text :
- https://doi.org/10.1002/crat.201700141