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Microstructural and Optoelectronic Properties of SiGe:H Films at the Transition Edge Fabricated by PECVD

Authors :
Fu Guang-Sheng
Guo Qiang
Yu Wei
Fan Shan-Shan
Wang Xinzhan
Source :
Crystal Research and Technology. 53:1700141
Publication Year :
2018
Publisher :
Wiley, 2018.

Details

ISSN :
02321300
Volume :
53
Database :
OpenAIRE
Journal :
Crystal Research and Technology
Accession number :
edsair.doi...........ea0a2c13d763e70ace87bb9c409dbaf6
Full Text :
https://doi.org/10.1002/crat.201700141