Cite

Study of thin anodic SiO2 layers on degenerate silicon by inelastic electron tunnelling spectroscopy

MLA

J. Despujols, and G. Salace. “Study of Thin Anodic SiO2 Layers on Degenerate Silicon by Inelastic Electron Tunnelling Spectroscopy.” Thin Solid Films, vol. 168, Jan. 1989, pp. 11–20. EBSCOhost, https://doi.org/10.1016/0040-6090(89)90684-6.



APA

J. Despujols, & G. Salace. (1989). Study of thin anodic SiO2 layers on degenerate silicon by inelastic electron tunnelling spectroscopy. Thin Solid Films, 168, 11–20. https://doi.org/10.1016/0040-6090(89)90684-6



Chicago

J. Despujols, and G. Salace. 1989. “Study of Thin Anodic SiO2 Layers on Degenerate Silicon by Inelastic Electron Tunnelling Spectroscopy.” Thin Solid Films 168 (January): 11–20. doi:10.1016/0040-6090(89)90684-6.