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Characteristic and Robustness of Trench Floating Limiting Rings for 4H-SiC Junction Barrier Schottky Rectifiers

Authors :
Yimen Zhang
Yuming Zhang
He Xiaoning
He Yanjing
Qingyou Qian
Yuan Hao
Tingsong Zhang
Li Xiao
Liu Yancong
Hu Yanfei
Qingwen Song
Xiaoyan Tang
Source :
IEEE Electron Device Letters. :1-1
Publication Year :
2020
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2020.

Abstract

In this letter, planar floating limiting rings (FLRs) and trench FLRs with different trench depths for the 4H-SiC junction barrier Schottky (JBS) rectifiers are analyzed and compared with simulations and experiments. Compared with the planar FLRs, the experimental results present that the first ring spacing window that termination efficiency exceeds 80% of the parallel plane breakdown voltage (BV) can be widened and termination area can be reduced at the same BV by adopting the trench FLRs. The simulations also indicate that there is an optimal trench depth for the trench FLRs and a smaller sidewall angle can achieve better device performance. Additionally, the repetitive avalanche current stress measurements imply that the trench FLRs has better robustness regarding the BV shift, achieving better device reliability.

Details

ISSN :
15580563 and 07413106
Database :
OpenAIRE
Journal :
IEEE Electron Device Letters
Accession number :
edsair.doi...........eabade2e42b169b0f5acd7c60eadebf8