Back to Search Start Over

IMS Technical Committee TC-22: Intelligent Measurement Systems

Authors :
Mel Siegel
Angelo Genovese
Source :
IEEE Instrumentation & Measurement Magazine. 24:14-17
Publication Year :
2021
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2021.

Abstract

This is article provides an overview of the IEEE Instrumentation and Measurement Society Technical Committee TC-22 on Intelligent Measurement Systems (https://ieee-ims.org/technical-committee/tc-22). The scope of the TC-22 is related to fostering development and use of artificial intelligence, computational intelligence, and soft computing in measurement systems and related applications [1]–[3].

Details

ISSN :
19410123 and 10946969
Volume :
24
Database :
OpenAIRE
Journal :
IEEE Instrumentation & Measurement Magazine
Accession number :
edsair.doi...........ebf7e5d32cb2731c3ee65274ad5867c5
Full Text :
https://doi.org/10.1109/mim.2021.9580792