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Optical properties of CdS0.2Se0.8:V
- Source :
- Journal of Electronic Materials. 32:783-788
- Publication Year :
- 2003
- Publisher :
- Springer Science and Business Media LLC, 2003.
-
Abstract
- We report here a comparison between two methods for calculating the index of refraction of the CdSxSe1−x alloy system and a calculation of the phase-matching angles for second harmonic generation for this system. Analytical expressions for the index and the birefringence of all x values are presented. The low-temperature photoluminescence spectrum has been measured and reveals a native defect at 1.45 eV and a peak at 1.8 eV caused by the vanadium dopant, as well as an exciton peak at 2.24 eV. The transmission spectrum displays three peaks due to the vanadium dopant at 0.979 eV, 1.087 eV, and 1.181 eV. The birefringence has been measured for x = 0.2 from 1 µm to 14 µm and varies from 0.0185 to 0.0125.
- Subjects :
- Photoluminescence
Birefringence
Absorption spectroscopy
Dopant
business.industry
Chemistry
Exciton
Second-harmonic generation
Vanadium
chemistry.chemical_element
Condensed Matter Physics
Molecular physics
Electronic, Optical and Magnetic Materials
Optics
Materials Chemistry
Electrical and Electronic Engineering
business
Refractive index
Subjects
Details
- ISSN :
- 1543186X and 03615235
- Volume :
- 32
- Database :
- OpenAIRE
- Journal :
- Journal of Electronic Materials
- Accession number :
- edsair.doi...........ec3c34746f9117f8153b77b205db3576
- Full Text :
- https://doi.org/10.1007/s11664-003-0071-9