Mapping residual stress using optical microprobe in alumina films formed by thermal oxidation of NiAI

Authors :: S. J. Webb
David R. Clarke
A. Atkinson
Source :: Materials Science and Technology. 14:531-534
Publication Year :: 1998
Publisher :: Informa UK Limited, 1998.
Abstract: Chromium ion luminescence spectroscopy with an optical microprobe has been used to map the residual compressive. stress in aluminafilms grown by high temperature thermal oxidation of NiAI single cr...

Subjects :: Thermal oxidation
Microprobe
Materials science
Mechanical Engineering
Metallurgy
Condensed Matter Physics
Residual
Chromium atom
Stress (mechanics)
Mechanics of Materials
Residual stress
General Materials Science
Luminescence
Spectroscopy

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