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Photoinduced trapping of charge at sulfur vacancies and copper ions in photorefractive Sn2P2S6 crystals

Authors :
Nancy C. Giles
Eric M. Golden
T. D. Gustafson
Larry E. Halliburton
Jonathan E. Slagle
S. A. Basun
Alexander A. Grabar
Elizabeth M. Scherrer
Dean R. Evans
Source :
Journal of Applied Physics. 129:085702
Publication Year :
2021
Publisher :
AIP Publishing, 2021.

Abstract

Electron paramagnetic resonance (EPR) is used to monitor photoinduced changes in the charge states of sulfur vacancies and Cu ions in tin hypothiodiphosphate. A Sn2P2S6 crystal containing Cu+ (3d10) ions at Sn2+ sites was grown by the chemical vapor transport method. Doubly ionized sulfur vacancies ( V S 2 +) are also present in the as-grown crystal (where they serve as charge compensators for the Cu+ ions). For temperatures below 70 K, exposure to 532 or 633 nm laser light produces stable Cu2+ (3d9) ions, as electrons move from Cu+ ions to sulfur vacancies. A g matrix and a 63,65Cu hyperfine matrix are obtained from the angular dependence of the Cu2+ EPR spectrum. Paramagnetic singly ionized ( V S +) and nonparamagnetic neutral ( V S 0) charge states of the sulfur vacancies, with one and two trapped electrons, respectively, are formed during the illumination. Above 70 K, the neutral vacancies ( V S 0) are thermally unstable and convert to V S + vacancies by releasing an electron to the conduction band. These released electrons move back to Cu2+ ions and restore Cu+ ions. Analysis of isothermal decay curves acquired by monitoring the intensity of the Cu2+ EPR spectrum between 74 and 82 K, after removing the light, gives an activation energy of 194 meV for the release of an electron from a V S 0 vacancy. Warming above 120 K destroys the V S + vacancies and the remaining Cu2+ ions. The photoinduced EPR spectrum from a small concentration of unintentionally present Ni+ ions at Sn2+ sites is observed near 40 K in the Sn2P2S6 crystal.

Details

ISSN :
10897550 and 00218979
Volume :
129
Database :
OpenAIRE
Journal :
Journal of Applied Physics
Accession number :
edsair.doi...........ecdcf20a5edef8ff2c666d781a59666f
Full Text :
https://doi.org/10.1063/5.0042905