X-Ray Diffraction Study of CoSiF66H2O and MnSiF66H2O at Low Temperatures

Subjects

Subjects :

Materials science
Reflection high-energy electron diffraction
X-ray crystallography
Analytical chemistry
General Physics and Astronomy
Selected area diffraction
Powder diffraction
Electron backscatter diffraction

Details

ISSN :

13474073 and 00319015

Volume :

32

Database :

OpenAIRE

Journal :

Journal of the Physical Society of Japan

Accession number :

edsair.doi...........ef29b520bb698d138bc92f1d2e368642

Full Text :

https://doi.org/10.1143/jpsj.32.863