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Surface roughening at the one-monolayer Sb/Si(100) interface

Authors :
V.G. Kotlyar
T. Harada
Osamu Kubo
Mitsuhiro Katayama
Kenjiro Oura
Nobumitsu Yamaoka
V.G. Lifshits
Tatsuo C. Kobayashi
Alexander A. Saranin
Andrey V. Zotov
Source :
Physical Review B. 65
Publication Year :
2001
Publisher :
American Physical Society (APS), 2001.

Abstract

Using scanning tunneling microscopy observations, it has been found that the atomically flat 1-ML Sb/ Si(100) interface is metastable at a temperature of about 750°C and becomes rough upon brief annealing, although the Sb-dimer-row structure of the top layer is completely preserved. The roughening is explained by displacive adsorption of Sb (i.e., by substitution of the top-layer Si atoms by Sb atoms) and this phenomenon is suggested to be a common one for group-V adsorbates on Si(100) and Ge(100) surfaces.

Details

ISSN :
10953795 and 01631829
Volume :
65
Database :
OpenAIRE
Journal :
Physical Review B
Accession number :
edsair.doi...........f1bc6ba66a5462622537f85e96a7f4c1
Full Text :
https://doi.org/10.1103/physrevb.65.033312