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Influence of Drain Bias and Flux on Heavy Ion-Induced Leakage Currents in SiC Power MOSFETs

Authors :
Chao Peng
Zhifeng Lei
Zhangang Zhang
Yiqiang Chen
Yujuan He
Bin Yao
Yunfei En
Source :
IEEE Transactions on Nuclear Science. 69:1037-1043
Publication Year :
2022
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2022.

Subjects

Subjects :
Nuclear and High Energy Physics
Nuclear Energy and Engineering
Electrical and Electronic Engineering

Details

ISSN :
15581578 and 00189499
Volume :
69
Database :
OpenAIRE
Journal :
IEEE Transactions on Nuclear Science
Accession number :
edsair.doi...........f1c4aeb59b9421d7f0e0825ab56b8c73
Full Text :
https://doi.org/10.1109/tns.2022.3166521
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