Zernike wavefront sensor (ZWFS) development for Low Order Wavefront Sensing (LOWFS)

ZWFS is known to be photon noise optimal for measuring low order aberrations. Recently, ZWFS was selected as the baseline LOWFS technology on WFIRST for its sensitivity, accuracy, and its ease of integration with the starlight rejection mask. In this paper, we present the development of ZWFS sensor, including the algorithm description, sensitivity analysis, and some early experimental model validation results from a fabricated ZWFS phase mask on a standalone LOWFS testbed.