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Thermal-assisted electroforming enables performance improvement by suppressing the overshoot current in amorphous carbon-based electrochemical metallization memory
- Source :
- Applied Physics Letters. 119:143505
- Publication Year :
- 2021
- Publisher :
- AIP Publishing, 2021.
-
Abstract
- A thermal-assisted electroforming (TAE) method is proposed to address the current overshoot issue and improve the resistive switching (RS) performance of electrochemical metallization (ECM) memory with a Cu/amorphous carbon (a-C)/Pt structure. In the initial electroforming process, thermal treatment can promote the electrochemical formation of metallic conductive filament (CF). The required electroforming voltage is reduced, and the undesirable overshoot current is suppressed. As a result, the RS performance of the cell is improved, including reduced RS parameter fluctuations, enlarged off/on ratio, and enhanced cycling endurance. The cell can be operated with a low compliance current (ICC) of 50 μA, which is among the lowest value of reported a-C-based ECM memories. Benefit from the low ICC, multilevel memory with five nonvolatile resistance states in a single cell is obtained. The main role of the TAE method is interpreted as to avoid the extreme high-temperature caused by the overshoot current. Conductive-atomic force microscopy mapping implies that the suppression of overshoot current can avoid over-injection of Cu cations into the a-C layer, facilitating CF with a simple structure and low randomness. The present work offers a feasible approach for addressing the current overshoot issue and improving the performance of ECM memory.
Details
- ISSN :
- 10773118 and 00036951
- Volume :
- 119
- Database :
- OpenAIRE
- Journal :
- Applied Physics Letters
- Accession number :
- edsair.doi...........f2aa34e877cc8ed6bbe721b6a2a03c4e