Use of Full-Field X- ray Imaging and Ptychographic X-ray Computed Tomography for the Investigation of 3D Morphology of Micro-Nano Silver Materials for Advanced Electronics Packaging Applications

Authors :: Esther H. R. Tsai
Yu-Chung Lin
Ana Diaz
Chonghang Zhao
Mirko Holler
Stanislas Petrash
Xiaoyang Liu
Yu-chen Karen Chen-Wiegart
Wah-Keat Lee
Kang-wei Chou
Source :: Microscopy and Microanalysis. 27:1026-1027
Publication Year :: 2021
Publisher :: Oxford University Press (OUP), 2021.

Subjects :: Materials science
Morphology (linguistics)
X ray computed
Micro nano
X-ray
Electronic packaging
Nanotechnology
Full field
Tomography
Instrumentation

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