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High-performance self-aligned gate AlGaAs/GaAs MODFET voltage comparator

Authors :
K.L. Tan
N.C. Cirillo
D.K. Arch
P.J. Vold
A.I. Akinwande
Source :
IEEE Electron Device Letters. 8:431-433
Publication Year :
1987
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 1987.

Abstract

A very high-performance voltage comparator circuit has been demonstrated using self-aligned gate AlGaAs/GaAs modulation-doped FET's (MODFET's)and laser-trimmable CrSi-based thin-film resistors. The MODFET master/slave comparator circuits demonstrated analog input resolutions of < 1 and 2.5 mV at sampling rates of 0.5 and 1 GHz, respectively, at Nyquist analog input rates at room temperature. The MODFET comparators operated to sampling rates greater than 2.5 GHz at Nyquist analog input rates. Static hysteresis of less than 1 mV was observed for some comparators at room temperature. The self-aligned gate MODFET's demonstrated average threshold-voltage offsets for closely spaced FET pairs of 2.53 ± 1.15 mV, and typical static hysteresis levels of < 1 to 3 mV. These MODFET comparators demonstrated the highest analog input resolution at gigahertz sampling frequencies ever reported, including comparators fabricated using AlGaAs/GaAs heterojunction bipolar transistors (HBT's).

Details

ISSN :
07413106
Volume :
8
Database :
OpenAIRE
Journal :
IEEE Electron Device Letters
Accession number :
edsair.doi...........f3a031c20d494c30fb5f7384501402a3