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New model of unit construction general test-adapter for ATE

Authors :
Ji-yin Sun
De-xin Du
Yi-fei Zhang
Source :
Journal of Computer Applications. 29:2878-2881
Publication Year :
2009
Publisher :
China Science Publishing & Media Ltd., 2009.

Details

ISSN :
10019081
Volume :
29
Database :
OpenAIRE
Journal :
Journal of Computer Applications
Accession number :
edsair.doi...........f5b8aa222f72385c23e66d41f8332833