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Fault Detection Circuit Based on IGBT Gate Signal
- Source :
- IEEE Latin America Transactions. 14:541-548
- Publication Year :
- 2016
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2016.
-
Abstract
- The detection circuit presented in this paper has the purpose of detecting short circuit and open circuit faults in insulated gate devices (IGBT). The detection circuit design is based on the analysis of the IGBT gate signal VGE, which is characterized by carrying out the fault detection within the IGBT switching times under test. The fast fault detection is due to the following considerations: a) Employing technology components with a high slew rate, allows the detection within the switching times, b) Employing fewer components allow the circuit design less expensive and faster, and This paper presents the experimental validation results for the proposed fault detection cases.
- Subjects :
- 010302 applied physics
Engineering
General Computer Science
business.industry
Circuit design
020208 electrical & electronic engineering
Electrical engineering
Slew rate
Hardware_PERFORMANCEANDRELIABILITY
02 engineering and technology
Insulated-gate bipolar transistor
Experimental validation
Discrete circuit
01 natural sciences
Signal
Fault detection and isolation
0103 physical sciences
Hardware_INTEGRATEDCIRCUITS
0202 electrical engineering, electronic engineering, information engineering
Electronic engineering
Electrical and Electronic Engineering
business
Short circuit
Hardware_LOGICDESIGN
Subjects
Details
- ISSN :
- 15480992
- Volume :
- 14
- Database :
- OpenAIRE
- Journal :
- IEEE Latin America Transactions
- Accession number :
- edsair.doi...........f5c2b1bb9d607f810a4908ba78b00aa2