A Fully Integrated Ferroelectric Thin‐Film‐Transistor – Influence of Device Scaling on Threshold Voltage Compensation in Displays

Authors :: Michael P. M. Jank
Norbert Hanisch
Varvara Brackmann
Tarek Ali
Shawn Sanctis
Martin Ellinger
Konrad Seidel
Songrui Li
Matthias Rudolph
Thomas Kampfe
Konstantin Mertens
David Lehninger
Kati Biedermann
Maximilian Lederer
Ricardo Olivio
Source :: Advanced Electronic Materials. 7:2100082
Publication Year :: 2021
Publisher :: Wiley, 2021.

Subjects :: Materials science
business.industry
Transistor
Electronic, Optical and Magnetic Materials
Compensation (engineering)
law.invention
Threshold voltage
Neuromorphic engineering
Thin-film transistor
law
Ferroelectric thin films
Optoelectronics
business
Scaling

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