A Study on the Scan Plans for Rapid Flaw Detection by Eddy Current Non-Destructive Evaluation

Authors :: Anil Kumar Soni
S. Mahadevan
S. Thirunavukkarasu
B. Purna Chandra Rao
Source :: IETE Journal of Research. :1-12
Publication Year :: 2022
Publisher :: Informa UK Limited, 2022.

Subjects :: Electrical and Electronic Engineering
Computer Science Applications
Theoretical Computer Science

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