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Inverse scattering approach with measurement of only total electric field
- Source :
- Microwave and Optical Technology Letters. 57:137-141
- Publication Year :
- 2014
- Publisher :
- Wiley, 2014.
-
Abstract
- An inverse scattering approach using only total electric field data is developed for reconstructing electrical parameters of unknown scatterers. Two interior boundary value problems are set up whose solutions coincide with each other if and only if a medium inside the observation surface is the same as that of the original scattering problem. A cost functional of misfit between the two solutions is introduced to solve the inverse problem and its gradient is derived explicitly. Numerical examples are provided to assess the proposed inversion approach. © 2015 Wiley Periodicals, Inc. Microwave Opt Technol Lett 57:137–141, 2015
- Subjects :
- Physics
Scattering
business.industry
Mathematical analysis
Inverse problem
Condensed Matter Physics
Atomic and Molecular Physics, and Optics
Electronic, Optical and Magnetic Materials
Optics
Microwave imaging
Electric field
Inverse scattering problem
Quantum inverse scattering method
Scattering theory
Boundary value problem
Electrical and Electronic Engineering
business
Subjects
Details
- ISSN :
- 08952477
- Volume :
- 57
- Database :
- OpenAIRE
- Journal :
- Microwave and Optical Technology Letters
- Accession number :
- edsair.doi...........fba6ca1fcccfb57564d73c50e2fb4c81
- Full Text :
- https://doi.org/10.1002/mop.28795