Characterization and Modeling of Flicker Noise in FinFETs at Advanced Technology Node

MLA

Chenming Hu, et al. “Characterization and Modeling of Flicker Noise in FinFETs at Advanced Technology Node.” IEEE Electron Device Letters, vol. 40, June 2019, pp. 985–88. EBSCOhost, https://doi.org/10.1109/led.2019.2911614.

APA

Chenming Hu, Joseph Wang, Pragya Kushwaha, Avirup Dasgupta, Sayeef Salahuddin, Harshit Agarwal, Yen-Kai Lin, Ye Lu, Frank Yang, Yun Yue, P. Chidambaram, Xiaonan Chen, Ming-Yen Kao, & Wing Sy. (2019). Characterization and Modeling of Flicker Noise in FinFETs at Advanced Technology Node. IEEE Electron Device Letters, 40, 985–988. https://doi.org/10.1109/led.2019.2911614

Chicago

Chenming Hu, Joseph Wang, Pragya Kushwaha, Avirup Dasgupta, Sayeef Salahuddin, Harshit Agarwal, Yen-Kai Lin, et al. 2019. “Characterization and Modeling of Flicker Noise in FinFETs at Advanced Technology Node.” IEEE Electron Device Letters 40 (June): 985–88. doi:10.1109/led.2019.2911614.