Back to Search Start Over

Using electrical bitmap results from embedded memory to enhance yield

Authors :
J. Segal
A. Jee
B. Chu
D. Lepejian
Source :
IEEE Design & Test of Computers. 18:28-39
Publication Year :
2001
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2001.

Abstract

Analyzing bitmap results can provide insight into physical failure mechanisms normally acquired only through the complex, time-consuming, and expensive process of failure analysis.

Subjects

Subjects :
Yield (engineering)
Computer science
business.industry
Process (computing)
Semiconductor memory
Embedded memory
Parallel computing
computer.file_format
Hardware and Architecture
Embedded system
Bitmap
Electrical and Electronic Engineering
business
computer
Software

Details

ISSN :
07407475
Volume :
18
Database :
OpenAIRE
Journal :
IEEE Design & Test of Computers
Accession number :
edsair.doi...........fe3b601815bf9b19ae9518e0f817fcbb
Full Text :
https://doi.org/10.1109/54.922801
Full Text Access
View/download PDF

Tools

Authors Abstract Subjects Details