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SDDNet: Real-Time Crack Segmentation
- Source :
- IEEE Transactions on Industrial Electronics. 67:8016-8025
- Publication Year :
- 2020
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2020.
-
Abstract
- This article reports the development of a pure deep learning method for segmenting concrete cracks in images. The objectives are to achieve the real-time performance while effectively negating a wide range of various complex backgrounds and crack-like features. To achieve the goals, an original convolutional neural network is proposed. The model consists of standard convolutions, densely connected separable convolution modules, a modified atrous spatial pyramid pooling module, and a decoder module. The semantic damage detection network (SDDNet) is trained on a manually created crack dataset, and the trained network records the mean intersection-over-union of 0.846 on the test set. Each test image is analyzed, and the representative segmentation results are presented. The results show that the SDDNet segments cracks effectively unless the features are too faint. The proposed model is also compared with the most recent models, which show that it returns better evaluation metrics even though its number of parameters is 88 times less than in the compared models. In addition, the model processes in real-time (36 FPS) images at 1025 × 512 pixels, which is 46 times faster than in a recent work.
- Subjects :
- Standard test image
Computer science
business.industry
Deep learning
020208 electrical & electronic engineering
Feature extraction
Pattern recognition
02 engineering and technology
Image segmentation
Convolutional neural network
Control and Systems Engineering
Test set
Pyramid
0202 electrical engineering, electronic engineering, information engineering
Segmentation
Pyramid (image processing)
Artificial intelligence
Electrical and Electronic Engineering
business
Subjects
Details
- ISSN :
- 15579948 and 02780046
- Volume :
- 67
- Database :
- OpenAIRE
- Journal :
- IEEE Transactions on Industrial Electronics
- Accession number :
- edsair.doi...........fe9d2d9c7edb1f632c9ff28cceb55649
- Full Text :
- https://doi.org/10.1109/tie.2019.2945265