Novel integrated CWDM demultiplexer and channel monitor in silica

A novel integrated demultiplexer and channel monitoring device is proposed and analyzed. The device uses multilayer graded index profile structure with α -parameter less than one. The effects of different relevant parameters such as refractive index profile parameter, thickness, input signal incident angle, number of layers and channel wavelength spacing on the structure are investigated. The component is recommended for course wavelength division multiplexing (CWDM) optical communication system applications.