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Thickness dependent electrical resistivity in amorphous Mg-Zn-Ca thin films
- Source :
- Thin Solid Films. 672:182-185
- Publication Year :
- 2019
- Publisher :
- Elsevier BV, 2019.
-
Abstract
- Electrical resistivity in amorphous Mg65Zn30Ca5 thin films with thicknesses ranging from 49 nm to 1786 nm is investigated by four-probe method at 4–300 K. It is revealed that for thickness from 94 nm to 1786 nm the Ziman-Faber diffraction model can describe temperature-dependent electrical resistivity, while for 49 nm-thick film the two-level system scattering mechanism is validated below 40 K and Ziman-Faber diffraction model above 40 K. More interface fraction between the columnar structures with enhanced heterogeneity could be the possible origin of two-level system scattering in thinnest film, instead of denser atomic packing.
Details
- ISSN :
- 00406090
- Volume :
- 672
- Database :
- OpenAIRE
- Journal :
- Thin Solid Films
- Accession number :
- edsair.doi...........fef4dc8e8c96a8b4015e60de11cfe886