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An investigation on the process control for the solid application of EUV MOR

Authors :
Sangjin Kim
Il-Hwan Kim
Hyungju Ryu
Yongbeom Seo
Yigwon Kim
Jinhee Jang
Tae-Min Choi
Sol Jeong
Yongchul Jeong
Kyoungyong Cho
Cheolin Jang
Kyeongbeom Park
Changmin Park
Source :
Optical and EUV Nanolithography XXXVI.
Publication Year :
2023
Publisher :
SPIE, 2023.

Details

Database :
OpenAIRE
Journal :
Optical and EUV Nanolithography XXXVI
Accession number :
edsair.doi...........ff99dfcd8db9e56006c7b4a39f61469f
Full Text :
https://doi.org/10.1117/12.2658345