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A hard X-ray nanoprobe beamline for nanoscale microscopy

Authors :
Peter Fuesz
Ian McNulty
Robert Winarski
Volker Rose
C. Benson
G. Brian Stephenson
Jörg Maser
Martin V. Holt
Deming Shu
David Kline
Dean Carbaugh
Source :
Journal of Synchrotron Radiation
Publication Year :
2012

Abstract

The Hard X-ray Nanoprobe Beamline is a precision platform for scanning probe and full-field microscopy with 3–30 keV X-rays. A combination of high-stability X-ray optics and precision motion sensing and control enables detailed studies of the internal features of samples with resolutions approaching 30 nm.<br />The Hard X-ray Nanoprobe Beamline (or Nanoprobe Beamline) is an X-ray microscopy facility incorporating diffraction, fluorescence and full-field imaging capabilities designed and operated by the Center for Nanoscale Materials and the Advanced Photon Source at Sector 26 of the Advanced Photon Source at Argonne National Laboratory. This facility was constructed to probe the nanoscale structure of biological, environmental and material sciences samples. The beamline provides intense focused X-rays to the Hard X-ray Nanoprobe (or Nanoprobe) which incorporates Fresnel zone plate optics and a precision laser sensing and control system. The beamline operates over X-ray energies from 3 to 30 keV, enabling studies of most elements in the periodic table, with a particular emphasis on imaging transition metals.

Details

ISSN :
16005775
Volume :
19
Issue :
Pt 6
Database :
OpenAIRE
Journal :
Journal of synchrotron radiation
Accession number :
edsair.doi.dedup.....02fec33c35e72b77b8621eae1a692851