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Computationally Efficient Physics-Based Compact CNTFET Model for Circuit Design

Authors :
Thomas Zimmer
Sebastien Fregonese
Cristell Maneux
H. Cazin d'Honincthun
Jean-Philippe Bourgoin
Philippe Dollfus
J. Goguet
S. Galdin-Retailleau
Laboratoire de l'intégration, du matériau au système (IMS)
Université Sciences et Technologies - Bordeaux 1 (UB)-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS)
Institut d'électronique fondamentale (IEF)
Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)
Département de Recherche sur l'Etat Condensé, les Atomes et les Molécules (DRECAM)
Commissariat à l'énergie atomique et aux énergies alternatives (CEA)
ANR-06-NANO-0069,ACCENT,Action Calcul Composants En NanoTubes de carbone : simulation multi-échelle, de l'atomistique au circuit(2006)
Université Sciences et Technologies - Bordeaux 1-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS)
ANR: ACCENT & HF CNTFET,ACCENT & HF CNTFET
Centre National de la Recherche Scientifique (CNRS)-Institut Polytechnique de Bordeaux-Université Sciences et Technologies - Bordeaux 1
Source :
IEEE Transactions on Electron Devices, IEEE Transactions on Electron Devices, 2008, 55 (6), pp.1317-1326, IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2008, 55 (6), pp.1317-1326
Publication Year :
2008
Publisher :
HAL CCSD, 2008.

Abstract

International audience; Abstract—We present a computationally efficient physics-based compact model designed for the conventional CNTFET featuring a MOSFET-like operation. A large part of its novelty lies on the implementation of a new analytical model of the channel charge. In addition, Boltzmann Monte Carlo (MC) simulation is performed with the challenge to cross-link this simulation technique to the compact modeling formulation. The comparison of the electrical characteristics obtained from the MC simulation and from the compact modeling demonstrates the compact model accuracy within its range of validity. Then, from a study of the CNT diameter dispersion for three technological processes, the compact model allows us to determine the CNTFET threshold voltage distribution and to evaluate the resulting dispersion of the propagation delay from the simulation of a ring oscillator.

Details

Language :
English
ISSN :
00189383
Database :
OpenAIRE
Journal :
IEEE Transactions on Electron Devices, IEEE Transactions on Electron Devices, 2008, 55 (6), pp.1317-1326, IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2008, 55 (6), pp.1317-1326
Accession number :
edsair.doi.dedup.....04c24a3d03fe039937fe1b477047c3d3