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Hardening approach to use CMOS image sensors for fusion by inertial confinement diagnostics
- Source :
- IEEE Transactions on Nuclear Science, IEEE Transactions on Nuclear Science, 2013, 60 (6), pp.4349-4355. ⟨10.1109/TNS.2013.2286673⟩
- Publication Year :
- 2013
- Publisher :
- IEEE, 2013.
-
Abstract
- International audience; A hardening method is proposed to enable the use of CMOS image sensors for Fusion by Inertial Confinement Diagnostics. The mitigation technique improves their radiation tolerance using a reset mode implemented in the device. The results obtained evidence a reduction of more than 70% in the number of transient white pixels induced in the pixel array by the mixed neutron and $gamma$ -ray pulsed radiation environment.
- Subjects :
- Nuclear and High Energy Physics
Astrophysics::High Energy Astrophysical Phenomena
ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION
Hardware_PERFORMANCEANDRELIABILITY
Single-event transient (SET)
CMOS Image Sensor (CIS)- Geant4
Neutron
Electrical and Electronic Engineering
Image sensor
Inertial confinement fusion
Physics
Neutrons
Fusion
Inertial confinement fusion (ICF)
Pixel
business.industry
Gamma ray
Micro et nanotechnologies/Microélectronique
Nuclear Energy and Engineering
CMOS
Active pixel sensor (APS)
Displacement damage dose (DDD)
Hardening (metallurgy)
[SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic
Optoelectronics
Dark current distribution
business
Subjects
Details
- Language :
- English
- ISSN :
- 00189499
- Database :
- OpenAIRE
- Journal :
- IEEE Transactions on Nuclear Science
- Accession number :
- edsair.doi.dedup.....082e16029b5a040572a4e6a259ff8025
- Full Text :
- https://doi.org/10.1109/TNS.2013.2286673⟩