Unclassified Wheat Identification with Bag of Contour Fragments

25th Signal Processing and Communications Applications Conference (SIU) -- MAY 15-18, 2017 -- Antalya, TURKEY
WOS: 000413813100169
Production of high quality wheat has a great importance especially in the solution of nutrition problems. It is necessary to make decomposition for specifying the quality. Here, high quality and unclassified wheat recognition are realized. The most distinctive feature between high quality and poor quality wheat is the shape difference. In this study, Bag of Contour Fragments (BCF) was used as a shape based descriptor. In contrast to general shape descriptors, BCF represents shape by dividing into small parts rather than entire one. These small fragments are then coded and classified by the Support Vector Machine (SVM) according to their histograms. In the study, a performance of % 70 accuracy rate was achieved.
Turk Telekom, Arcelik A S, Aselsan, ARGENIT, HAVELSAN, NETAS, Adresgezgini, IEEE Turkey Sect, AVCR Informat Technologies, Cisco, i2i Syst, Integrated Syst & Syst Design, ENOVAS, FiGES Engn, MS Spektral, Istanbul Teknik Univ