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Evaluating a radiation monitor for mixed-field environments based on SRAM technology
- Source :
- Journal of Instrumentation, Journal of Instrumentation, IOP Publishing, 2014, 9 (5), pp.#C05052. ⟨10.1088/1748-0221/9/05/C05052⟩
- Publication Year :
- 2014
- Publisher :
- IOP Publishing, 2014.
-
Abstract
- International audience; Instruments operating in particle accelerators and colliders are exposed to radiations that are composed of particles of different types and energies. Several of these instruments often embed devices that are not hardened against radiation effects. Thus, there is a strong need for monitoring the levels of radiation inside the mixed-field radiation areas, throughout different positions. Different metrics exist for measuring the radiation damage induced to electronic devices, such as the Total Ionizing Dose (TID), the Displacement Damage (DD) and of course the fluence of particles for estimating the error rates of the electronic devices among other applications. In this paper, we propose an SRAM based monitor, that is used to define the fluence of High Energy Hadrons (HEH) by detecting Single Event Upsets in the memory array. We evaluated the device by testing it inside the H4IRRAD area of CERN, a test area that reproduces the radiation conditions inside the Large Hadron Collider (LHC) tunnel and its shielded areas. By using stability estimation methods and presenting experimental data, we prove that this device is proper to be used for such a purpose.
- Subjects :
- Mixed particle fields
Nuclear engineering
Particle detectors
Radmon
Real-time monitoring
Radiation
01 natural sciences
law.invention
law
0103 physical sciences
Shielded cable
Radiation damage
Electronics
Static random-access memory
Instrumentation
Mathematical Physics
[PHYS]Physics [physics]
010302 applied physics
Physics
Large Hadron Collider
010308 nuclear & particles physics
business.industry
Electrical engineering
Particle accelerator
Monitor
SRAM
H4IRRAD
Particle accelerators
[SPI.TRON]Engineering Sciences [physics]/Electronics
Absorbed dose
business
SEU
Digital electronic circuits
Subjects
Details
- ISSN :
- 17480221
- Volume :
- 9
- Database :
- OpenAIRE
- Journal :
- Journal of Instrumentation
- Accession number :
- edsair.doi.dedup.....0ac343ca08b6b438b5e657399469620c
- Full Text :
- https://doi.org/10.1088/1748-0221/9/05/c05052