Surface sensitivity of four-probe STM resistivity measurements of bulk ZnO correlated to XPS

MLA

Chris J. Barnett, et al. “Surface Sensitivity of Four-Probe STM Resistivity Measurements of Bulk ZnO Correlated to XPS.” Journal of Physics. Condensed Matter : An Institute of Physics Journal, vol. 29, no. 38, July 2017. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi.dedup.....0af5f13f93b198d1d17d46dd4a367be1&authtype=sso&custid=ns315887.

APA

Chris J. Barnett, Jonathan E. Evans, Andrew R. Barron, Martin W. Allen, Alex M. Lord, & Steve P. Wilks. (2017). Surface sensitivity of four-probe STM resistivity measurements of bulk ZnO correlated to XPS. Journal of Physics. Condensed Matter : An Institute of Physics Journal, 29(38).

Chicago

Chris J. Barnett, Jonathan E. Evans, Andrew R. Barron, Martin W. Allen, Alex M. Lord, and Steve P. Wilks. 2017. “Surface Sensitivity of Four-Probe STM Resistivity Measurements of Bulk ZnO Correlated to XPS.” Journal of Physics. Condensed Matter : An Institute of Physics Journal 29 (38). http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi.dedup.....0af5f13f93b198d1d17d46dd4a367be1&authtype=sso&custid=ns315887.