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The atomic hydrogen flux to silicon growth flux ratio during microcrystalline silicon solar cell deposition

Authors :
G Gijs Dingemans
Wmm Erwin Kessels
van den Mn Menno Donker
van de Mcm Richard Sanden
Aad Gordijn
D Hrunski
Plasma & Materials Processing
Atomic scale processing
Source :
Applied physics letters 93, 111914 (2008). doi:10.1063/1.2987519, Applied Physics Letters, 93(11):111914, 111914-1/3. American Institute of Physics
Publication Year :
2008
Publisher :
AIP Publishing, 2008.

Abstract

The H flux to Si growth flux ratio is experimentally determined under state-of-the-art silicon thin-film deposition conditions by employing the recently introduced etch product detection technique. Under the technologically relevant high-pressure depletion conditions and for different process parameter settings such as pressure, SiH4 concentration, rf power, and excitation frequency, it was demonstrated that the microcrystalline to amorphous silicon phase transition is uniquely and reactor independently determined by the flux ratio of H and Si growth species. (C) 2008 American Institute of Physics.

Details

ISSN :
10773118 and 00036951
Volume :
93
Database :
OpenAIRE
Journal :
Applied Physics Letters
Accession number :
edsair.doi.dedup.....0ed69c7d698fc851422348f037c9f6de
Full Text :
https://doi.org/10.1063/1.2987519