Imaging junctions of waveguides

Authors :: Arnaud Recoquillay
Jean-François Fritsch
Laurent Bourgeois
Propagation des Ondes : Étude Mathématique et Simulation (POEMS)
Inria Saclay - Ile de France
Institut National de Recherche en Informatique et en Automatique (Inria)-Institut National de Recherche en Informatique et en Automatique (Inria)-Unité de Mathématiques Appliquées (UMA)
École Nationale Supérieure de Techniques Avancées (ENSTA Paris)-École Nationale Supérieure de Techniques Avancées (ENSTA Paris)-Centre National de la Recherche Scientifique (CNRS)
Commissariat à l'énergie atomique et aux énergies alternatives (CEA)
Source :: Inverse Problems and Imaging, Inverse Problems and Imaging, 2021, ⟨10.3934/ipi.2020065⟩, Inverse Problems and Imaging, AIMS American Institute of Mathematical Sciences, 2021, ⟨10.3934/ipi.2020065⟩
Publication Year :: 2021
Publisher :: HAL CCSD, 2021.
Abstract: International audience; In this paper we address the identification of defects by the Linear Sampling Method in half-waveguides which are related to each other by junctions. Firstly a waveguide which is characterized by an abrupt change of properties is considered, secondly the more difficult case of several half-waveguides related to each other by a junction of complex geometry. Our approach is illustrated by some two-dimensional numerical experiments.

Language :: English
ISSN :: 19308337 and 19308345
Database :: OpenAIRE
Journal :: Inverse Problems and Imaging, Inverse Problems and Imaging, 2021, ⟨10.3934/ipi.2020065⟩, Inverse Problems and Imaging, AIMS American Institute of Mathematical Sciences, 2021, ⟨10.3934/ipi.2020065⟩
Accession number :: edsair.doi.dedup.....0f5ac0bf0f88ef96278418e6a31a59ae

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