Back to Search Start Over

Spin tunneling random access memory (STram)

Authors :
Yoshihisa Nakamura
Zhi Gang Wang
Source :
IEEE Transactions on Magnetics. 32(5):4022-4024
Publication Year :
1996
Publisher :
Institute of Electrical and Electronics Engineers, 1996.

Abstract

A storage mechanism in ferromagnetic-insulator-ferromagnetic spin-polarized tunneling junctions has been found by us. Based on this mechanism, we designed and fabricated a 2/spl times/2 bit Spin Tunneling Random Access Memory (STram). These junctions provide an excellent means of storing a binary data in the hard components, and sensing its remanent state by switching the soft component in such a way that the magnetic state of the hard component remains unaltered.

Details

Language :
English
ISSN :
00189464
Volume :
32
Issue :
5
Database :
OpenAIRE
Journal :
IEEE Transactions on Magnetics
Accession number :
edsair.doi.dedup.....0f907f6bcba2fc82307a4897c6af2bd6