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Atomic Imaging of the Irreversible Sensing Mechanism of NO2 Adsorption on Copper Phthalocyanine

Authors :
Jun Hong Park
Tyler Kent
Evgeniy Chagarov
William C. Trogler
James E. Royer
Andrew C. Kummel
Mary Edmonds
Tobin Kaufman-Osborn
Sangyeob Lee
Source :
Park, JH; Royer, JE; Chagarov, E; Kaufman-Osborn, T; Edmonds, M; Kent, T; et al.(2013). Atomic imaging of the irreversible sensing mechanism of NO2 adsorption on copper phthalocyanine. Journal of the American Chemical Society, 135(39), 14600-14609. doi: 10.1021/ja403752r. UC San Diego: Retrieved from: http://www.escholarship.org/uc/item/8085g7r7
Publication Year :
2013
Publisher :
American Chemical Society (ACS), 2013.

Abstract

Ambient NO2 adsorption onto copper(II) phthalocyanine (CuPc) monolayers is observed using ultrahigh vacuum (UHV) scanning tunneling microscopy (STM) to elucidate the molecular sensing mechanism in CuPc chemical vapor sensors. For low doses (1 ppm for 5 min) of NO2 at ambient temperatures, isolated chemisorption sites on the CuPc metal centers are observed in STM images. These chemisorbates almost completely desorb from the CuPc monolayer after annealing at 100 C for 30 min. Conversely, for high NO 2 doses (10 ppm for 5 min), the NO2 induces a fracture of the CuPc domains. This domain fracture can only be reversed by annealing above 150 C, which is consistent with dissociative chemisorption into NO and atomic O accompanied by surface restructuring. This high stability implies that the domain fracture results from tightly bound adsorbates, such as atomic O. Existence of atomic O on or under the CuPc layer, which results in domain fracture, is revealed by XPS analysis and ozone-dosing experiments. The observed CuPc domain fracturing is consistent with a mechanism for the dosimetric sensing of NO2 and other reactive gases by CuPc organic thin film transistors (OTFTs). © 2013 American Chemical Society.

Details

ISSN :
15205126 and 00027863
Volume :
135
Database :
OpenAIRE
Journal :
Journal of the American Chemical Society
Accession number :
edsair.doi.dedup.....11bad889ddfe65ca387b9807c619fdcb
Full Text :
https://doi.org/10.1021/ja403752r