Cite
On the use of atomic force microscopy for structural mapping of metallic-glass thin films
MLA
Jean-Jacques Blandin, et al. On the Use of Atomic Force Microscopy for Structural Mapping of Metallic-Glass Thin Films. Jan. 2014. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi.dedup.....141e20310a9b55c1a99706a9c90314ba&authtype=sso&custid=ns315887.
APA
Jean-Jacques Blandin, Jinn P. Chu, A. Volland, Yong Yang, J.F. Zeng, Sébastien Gravier, & Y. C. Chen. (2014). On the use of atomic force microscopy for structural mapping of metallic-glass thin films.
Chicago
Jean-Jacques Blandin, Jinn P. Chu, A. Volland, Yong Yang, J.F. Zeng, Sébastien Gravier, and Y. C. Chen. 2014. “On the Use of Atomic Force Microscopy for Structural Mapping of Metallic-Glass Thin Films,” January. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi.dedup.....141e20310a9b55c1a99706a9c90314ba&authtype=sso&custid=ns315887.