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Focusing hard x rays beyond the critical angle of total reflection by adiabatically focusing lenses

Authors :
Frank Seiboth
A. Jahn
Robert Hoppe
Christian Wenzel
Ulrike Boesenberg
Stephan Ritter
Christian G. Schroer
Gerald Falkenberg
Maria Scholz
Karola Richter
Jens Patommel
D. Samberg
Susanne Klare
Johann W. Bartha
Felix Wittwer
Source :
Applied physics letters 110(10), 101103 (2017). doi:10.1063/1.4977882
Publication Year :
2017
Publisher :
American Inst. of Physics, 2017.

Abstract

Applied physics letters 110(10), 101103 (2017). doi:10.1063/1.4977882<br />In response to the conjecture that the numerical aperture of x-ray optics is fundamentally limited by the critical angle of total reflection [Bergemann et al., Phys. Rev. Lett. 91, 204801 (2003)], the concept of adiabatically focusing refractive lenses was proposed to overcome this limit [Schroer and Lengeler, Phys. Rev. Lett. 94, 054802 (2005)]. We present an experimental realization of these optics made of silicon and demonstrate that they indeed focus 20 keV x rays to a 18.4 nm focus with a numerical aperture of 1.73(9) × 10$^{−3}$ that clearly exceeds the critical angle of total reflection of 1.55 mrad.<br />Published by American Inst. of Physics, Melville, NY

Details

Language :
English
Database :
OpenAIRE
Journal :
Applied physics letters 110(10), 101103 (2017). doi:10.1063/1.4977882
Accession number :
edsair.doi.dedup.....1557074c8b7d60a36412dd4fd02dc3ee
Full Text :
https://doi.org/10.1063/1.4977882