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Quantum Dot Made in Metal Oxide Silicon-Nanowire Field Effect Transistor Working at Room Temperature
- Source :
- Nano Letters, Nano Letters, American Chemical Society, 2015, 15 (5), pp.2958-2964. ⟨10.1021/nl504806s⟩, Nano Letters, 2015, 15 (5), pp.2958-2964. ⟨10.1021/nl504806s⟩
- Publication Year :
- 2015
- Publisher :
- HAL CCSD, 2015.
-
Abstract
- International audience; We report the observation of an atomic like behavior from T = 4.2 K up to room temperature in n- and p-type Omega-gate silicon nanowire (NW) transistors. For that purpose, we modified the design of a NW transistor and introduced long spacers between the source/drain and the channel in order to separate the channel from the electrodes. The channel was made extremely small (3.4 nm in diameter with 10 nm gate length) with a thick gate oxide (7 nm) in order to enhance the Coulomb repulsion between carriers, which can be as large as 200 meV when surface roughness promotes charge confinement. Parasitic stochastic Coulomb blockade effect can be eliminated in our devices by choosing proper control voltages. Moreover, the quantum dot can be tuned so that the resonant current at T = 4.2 K exceeds that at room temperature.
- Subjects :
- Materials science
Nanowire
Quantum Dot
Bioengineering
Conduction
law.invention
law
Gate oxide
Surface roughness
General Materials Science
Single-Electron Transistor
[PHYS]Physics [physics]
business.industry
Mechanical Engineering
Transistor
Coulomb blockade
General Chemistry
Condensed Matter Physics
Artificial Atom
Tunnel-Junctions
Quantum dot
Silicon Single Electron Transistor
Electrode
Optoelectronics
Field-effect transistor
Coulomb-Blockade
Silicon Nanowire
business
Subjects
Details
- Language :
- English
- ISSN :
- 15306984 and 15306992
- Database :
- OpenAIRE
- Journal :
- Nano Letters, Nano Letters, American Chemical Society, 2015, 15 (5), pp.2958-2964. ⟨10.1021/nl504806s⟩, Nano Letters, 2015, 15 (5), pp.2958-2964. ⟨10.1021/nl504806s⟩
- Accession number :
- edsair.doi.dedup.....1cde5a10f97e376d3a9c05d9601057c7
- Full Text :
- https://doi.org/10.1021/nl504806s⟩