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AFM-based manipulation of InAs nanowires
- Source :
- Journal of Physics: Conference Series. 100:052051
- Publication Year :
- 2008
- Publisher :
- IOP Publishing, 2008.
-
Abstract
- A controlled method of manipulation of nanowires was found using the tip of an Atomic Force Microscope (AFM). Manipulation is done in the ‘Retrace Lift’ mode, where feedback is turned off for the reverse scan and the tip follows a nominal path. The effective manipulation force during the reverse scan can be changed by varying an offset in the height of the tip over the surface. Using this method, we have studied InAs nanowires on different substrates. We have also investigated interactions between wires and with gold features patterned onto the substrates.
- Subjects :
- Atomic force microscopes
History
Materials science
Nanowires
business.industry
Atomic force microscopy
Nanowire
Nanotechnology
Condensed Matter Physics
Computer Science Applications
Education
Lift (force)
InAs
Semiconducting indium
Optoelectronics
Different substrates
Nominal path
AFM
business
Den kondenserade materiens fysik
Method of manipulation
Subjects
Details
- ISSN :
- 17426596
- Volume :
- 100
- Database :
- OpenAIRE
- Journal :
- Journal of Physics: Conference Series
- Accession number :
- edsair.doi.dedup.....1e279a8455cae172964097627c0367ed