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Root-mean-square measurement of distinct voltage signals

Authors :
Shahram Minaei
Erkan Yuce
Sezai Tokat
Doğuş Üniversitesi, Mühendislik Fakültesi, Elektronik ve Haberleşme Mühendisliği Bölümü
TR46127
TR1566
TR14412
Minaei, Shahram
Publication Year :
2007
Publisher :
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2007.

Abstract

A circuit for measuring the root-mean-square (RMS) value of N distinct voltage signals, which employs two second-generation current conveyors and 2N + 1 metal-oxide-semiconductor transistors, is presented. The proposed circuit can find applications in measuring the RMS value of the output error signal of an artificial neural network (ANN). The presented network can also be used for realizing half- and full-wave rectifications. The proposed circuit does not use resistances and capacitances; therefore, it can operate at high frequencies. The results of the calculations are verified using SPICE simulations. C1 [Yuce, Erkan] Pamukkale Univ, Dept Elect & Elect Engn, TR-20070 Denizli, Turkey. [Minaei, Shahram] Dogus Univ, Dept Elect & Commun Engn, TR-34722 Istanbul, Turkey. [Tokat, Sezai] Pamukkale Univ, Dept Comp Engn, TR-20070 Denizli, Turkey.

Details

Language :
English
Database :
OpenAIRE
Accession number :
edsair.doi.dedup.....1ebacdcd6601023c231fd3b1b0ef578d