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Determination of composition, residual stress and stacking fault depth profiles in expanded austenite with energy-dispersive diffraction
- Source :
- Thin Solid Films, Thin Solid Films, Elsevier, 2013, 530, pp.71-76. ⟨10.1016/j.tsf.2012.06.029⟩
- Publication Year :
- 2013
- Publisher :
- HAL CCSD, 2013.
-
Abstract
- A methodology is proposed combining the scattering vector method with energy dispersive diffraction for the non-destructive determination of stress- and composition-depth profiles. The advantage of the present method is a relatively short measurement time and avoidance of tedious sublayer removal; the disadvantage as compared to destructive methods is that depth profiles can only be obtained for depth shallower than half the layer thickness. The proposed method is applied to an expanded austenite layer on stainless steel and al- lows the separation of stress, composition and stacking fault density gradients.; International audience; A methodology is proposed combining the scattering vector method with energy dispersive diffraction for the non-destructive determination of stress- and composition-depth profiles. The advantage of the present method is a relatively short measurement time and avoidance of tedious sublayer removal; the disadvantage as compared to destructive methods is that depth profiles can only be obtained for depth shallower than half the layer thickness. The proposed method is applied to an expanded austenite layer on stainless steel and al- lows the separation of stress, composition and stacking fault density gradients.
- Subjects :
- Diffraction
matière Condensée: Science des matériaux [Physique]
Materials science
Matériaux [Sciences de l'ingénieur]
Surface engineering
Residual stress
02 engineering and technology
01 natural sciences
Energy-dispersive diffraction
[SPI.MAT]Engineering Sciences [physics]/Materials
Stress (mechanics)
0103 physical sciences
[SPI.MECA.MEMA]Engineering Sciences [physics]/Mechanics [physics.med-ph]/Mechanics of materials [physics.class-ph]
Materials Chemistry
Composite material
Mécanique: Mécanique des matériaux [Sciences de l'ingénieur]
010302 applied physics
Austenite
Scattering
Metals and Alloys
Surfaces and Interfaces
021001 nanoscience & nanotechnology
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Crystallography
[PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci]
0210 nano-technology
Layer (electronics)
Energy (signal processing)
Stacking fault
Subjects
Details
- Language :
- English
- ISSN :
- 00406090
- Database :
- OpenAIRE
- Journal :
- Thin Solid Films, Thin Solid Films, Elsevier, 2013, 530, pp.71-76. ⟨10.1016/j.tsf.2012.06.029⟩
- Accession number :
- edsair.doi.dedup.....216ca073b7a4ec11e308589494fd9860
- Full Text :
- https://doi.org/10.1016/j.tsf.2012.06.029⟩