Back to Search
Start Over
Note: Mechanical in situ exfoliation of van der Waals materials
- Source :
- Review of Scientific Instruments, Vol. 88, No 7 (2017) P. 076104
- Publication Year :
- 2017
-
Abstract
- Exfoliation, namely, the peeling of layered materials down to a single unit-cell thin foil, opens promising avenues to fabricate novel electronic materials. New properties and original functionalities emerge in the single and few layer configurations of a number of layered compounds, in particular in transition metal dichalcogenides. However, many of these thin exfoliated materials are very sensitive to ambient conditions impeding the exploration of this new and fascinating parameter space. Here we describe a method of mechanical exfoliation in ultra-high vacuum (UHV). This technique is easily adaptable to any UHV system and allows preparing and studying air sensitive nanoflakes in situ. We present the basic design and proof-of-concept scanning tunneling microscopy imaging of VSe2 nanoflakes.
- Subjects :
- In situ
Materials science
Nanotechnology
02 engineering and technology
ddc:500.2
01 natural sciences
law.invention
symbols.namesake
Transition metal dichalcogenide
Transition metal
law
0103 physical sciences
Exfoliation
010306 general physics
Scanning tunneling microscopy
Instrumentation
FOIL method
Ultra high vacuum
021001 nanoscience & nanotechnology
Exfoliation joint
symbols
Scanning tunneling microscope
van der Waals force
0210 nano-technology
Layer (electronics)
Electronic materials
Subjects
Details
- ISSN :
- 10897623 and 00346748
- Volume :
- 88
- Issue :
- 7
- Database :
- OpenAIRE
- Journal :
- The Review of scientific instruments
- Accession number :
- edsair.doi.dedup.....21e7fde906681a036a296af147af9aa3