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Direct Measurement of Three-Dimensional Forces in Atomic Force Microscopy

Authors :
R. Sri Muthu Mrinalini
R. Sriramshankar
G. R. Jayanth
Source :
IEEE/ASME Transactions on Mechatronics. 20:2184-2193
Publication Year :
2015
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2015.

Abstract

Direct measurement of three-dimensional (3-D) forces between an atomic force microscope (AFM) probe and the sample benefits diverse applications of AFM, including force spectroscopy, nanometrology, and manipulation. This paper presents the design and evaluation of a measurement system, wherein the deflection of the AFM probe is obtained at two points to enable direct measurement of all the three components of 3-D tip-sample forces in real time. The optimal locations for measurement of deflection on the probe are derived for a conventional AFM probe. Further, a new optimal geometry is proposed for the probe that enables measurement of 3-D forces with identical sensitivity and nearly identical resolution along all three axes. Subsequently, the designed measurement system and the optimized AFM probe are both fabricated and evaluated. The evaluation demonstrates accurate measurement of tip-sample forces with minimal cross-sensitivities. Finally, the real-time measurement system is employed as part of a feedback control system to regulate the normal component of the interaction force, and to perform force-controlled scribing of a groove on the surface of polymethyl methacrylate.

Details

ISSN :
1941014X and 10834435
Volume :
20
Database :
OpenAIRE
Journal :
IEEE/ASME Transactions on Mechatronics
Accession number :
edsair.doi.dedup.....27cd0d6e78d86cf33d0652ec08cd49af
Full Text :
https://doi.org/10.1109/tmech.2014.2366794