Back to Search
Start Over
Direct Measurement of Three-Dimensional Forces in Atomic Force Microscopy
- Source :
- IEEE/ASME Transactions on Mechatronics. 20:2184-2193
- Publication Year :
- 2015
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2015.
-
Abstract
- Direct measurement of three-dimensional (3-D) forces between an atomic force microscope (AFM) probe and the sample benefits diverse applications of AFM, including force spectroscopy, nanometrology, and manipulation. This paper presents the design and evaluation of a measurement system, wherein the deflection of the AFM probe is obtained at two points to enable direct measurement of all the three components of 3-D tip-sample forces in real time. The optimal locations for measurement of deflection on the probe are derived for a conventional AFM probe. Further, a new optimal geometry is proposed for the probe that enables measurement of 3-D forces with identical sensitivity and nearly identical resolution along all three axes. Subsequently, the designed measurement system and the optimized AFM probe are both fabricated and evaluated. The evaluation demonstrates accurate measurement of tip-sample forces with minimal cross-sensitivities. Finally, the real-time measurement system is employed as part of a feedback control system to regulate the normal component of the interaction force, and to perform force-controlled scribing of a groove on the surface of polymethyl methacrylate.
- Subjects :
- Materials science
business.industry
System of measurement
Force spectroscopy
Atomic force acoustic microscopy
Conductive atomic force microscopy
Computer Science Applications
Nanometrology
Optics
Control and Systems Engineering
Deflection (engineering)
Instrumentation Appiled Physics
Electrical and Electronic Engineering
Magnetic force microscope
business
Non-contact atomic force microscopy
Subjects
Details
- ISSN :
- 1941014X and 10834435
- Volume :
- 20
- Database :
- OpenAIRE
- Journal :
- IEEE/ASME Transactions on Mechatronics
- Accession number :
- edsair.doi.dedup.....27cd0d6e78d86cf33d0652ec08cd49af
- Full Text :
- https://doi.org/10.1109/tmech.2014.2366794