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Polarization and higher order content measurement of a soft-x-rays monochromatized beam with Mo/Si multilayers
- Source :
- Applied optics 45 (2006): 1985–1992., info:cnr-pdr/source/autori:Pelizzo, MG; Frassetto, F; Nicolosi, P; Giglia, A; Mahne, N; Nannarone, S/titolo:Polarization and higher-order content measurement of a soft-x-ray monochromatized beam with Mo-Si multilayers/doi:/rivista:Applied optics/anno:2006/pagina_da:1985/pagina_a:1992/intervallo_pagine:1985–1992/volume:45
- Publication Year :
- 2006
-
Abstract
- A Mo-Si multilayer mirror has been used for determination of the ellipticity and higher-order content of a synchrotron beam. The method is based on the angular measure of multilayer reflectivity in the region of Bragg first- and second-order reflections. Beam parameters were derived by a fitting procedure. (c) 2006 Optical Society of America.
- Subjects :
- ELETTRA
multilayers
Materials Science (miscellaneous)
Physics::Optics
Synchrotron radiation
Industrial and Manufacturing Engineering
law.invention
SYNCHROTRON-RADIATION
synchrotron radiation
Optics
law
Light beam
Business and International Management
Thin film
PHOTOEMISSION
Physics
DESIGN METHOD
Beam diameter
business.industry
Polarization (waves)
Synchrotron
LIGHT
X-ray crystallography
Physics::Accelerator Physics
Laser beam quality
business
Subjects
Details
- Language :
- English
- Database :
- OpenAIRE
- Journal :
- Applied optics 45 (2006): 1985–1992., info:cnr-pdr/source/autori:Pelizzo, MG; Frassetto, F; Nicolosi, P; Giglia, A; Mahne, N; Nannarone, S/titolo:Polarization and higher-order content measurement of a soft-x-ray monochromatized beam with Mo-Si multilayers/doi:/rivista:Applied optics/anno:2006/pagina_da:1985/pagina_a:1992/intervallo_pagine:1985–1992/volume:45
- Accession number :
- edsair.doi.dedup.....2dbae0598929ecb4e6f68d52619308b7