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Towards A Test Paths Generation Method for CTCS Level Transition

Authors :
Guo Jin
Li Yao
Zhang Xiao-xia
Gao Hao
Zhang Yadong
Source :
MATEC Web of Conferences, Vol 325, p 01001 (2020)
Publication Year :
2020
Publisher :
EDP Sciences, 2020.

Abstract

Test case is an important basis for correctness and safety verification of Chinese Train Control System (CTCS). Focusing on the test cases generation method of UPPAAL which is widely used in CTCS testing activity, the problems are analyzed, and an improved test cases generation method for CTCS is proposed. First, the process and characteristics of UPPAAL test cases generation method are analyzed; then the test requirements of CTCS are studied, and a test cases generation method based on UPPAAL query file is proposed. Finally, taking the level transition function of CTCS as an example, test cases are generated by the proposed method, which shows that this method can meet the test requirements of CTCS.

Details

Language :
English
Volume :
325
Database :
OpenAIRE
Journal :
MATEC Web of Conferences
Accession number :
edsair.doi.dedup.....3404c0f994c38f0769eff75f05d5d279